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Proceedings Paper

Plasmons in nanoscale metal junctions: optical rectification and thermometry
Author(s): Douglas Natelson; Daniel R. Ward; Falco Hüser; Fabian Pauly; Juan Carlos Cuevas; David A. Corley; James M. Tour
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Paper Abstract

We use simultaneous electronic transport and optical characterization measurements to reveal new information about electronic and optical processes in nanoscale junctions fabricated by electromigration. Comparing electronic tunneling and photocurrents allows us to infer the optical frequency potential difference produced by the plasmon response of the junction. Together with the measured tunneling conductance, we can then determine the locally enhanced electric field within the junction. In similar structures containing molecules, anti-Stokes and Stokes Raman emission allow us to infer the effective local vibrational and electronic temperatures as a function of DC current, examining heating and dissipation on the nanometer scale.

Paper Details

Date Published: 20 September 2011
PDF: 13 pages
Proc. SPIE 8096, Plasmonics: Metallic Nanostructures and Their Optical Properties IX, 80961O (20 September 2011); doi: 10.1117/12.892328
Show Author Affiliations
Douglas Natelson, Rice Univ. (United States)
Daniel R. Ward, Rice Univ. (United States)
Falco Hüser, Karlsruher Institut für Technologie (Germany)
Fabian Pauly, Karlsruher Institut für Technologie (Germany)
Juan Carlos Cuevas, Univ. Autónoma de Madrid (Spain)
David A. Corley, Rice Univ. (United States)
James M. Tour, Rice Univ. (United States)


Published in SPIE Proceedings Vol. 8096:
Plasmonics: Metallic Nanostructures and Their Optical Properties IX
Mark I. Stockman, Editor(s)

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