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Proceedings Paper

Application of focusing x-ray spectrograph with spatial resolution and uniform dispersion in Z-pinch plasmas measurement
Author(s): Qingguo Yang; Yan Ye; Guanghua Chen; Zeren Li; Qixian Peng
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Paper Abstract

Application of focusing x-ray spectrograph with spatial resolution and uniform dispersion in measurement of the imploding Al wire array z-pinch plasma is reported. Uniform dispersion (i.e., the linear dispersion is a constant, or in other words, the x-rays are dispersed on the detector with uniform spacing for every wavelength) is realized by bending the crystal of a spectrograph into a special shape. Since the spatial coordinate of the spectrum obtained by this spectrograph varies linearly with x-ray wavelength, it is very convenient for identification and processing of the experimental spectrum. The experimental results show that this spectrograph has high luminosity, high spectral and spatial resolution and is very suitable for the routine spectrum measurement on the Z-pinch facility or other high-energy-density-physics (HEDP) facilities.

Paper Details

Date Published: 28 September 2011
PDF: 6 pages
Proc. SPIE 8139, Advances in X-Ray/EUV Optics and Components VI, 81390M (28 September 2011); doi: 10.1117/12.892292
Show Author Affiliations
Qingguo Yang, China Academy of Engineering Physics (China)
Yan Ye, China Academy of Engineering Physics (China)
Guanghua Chen, China Academy of Engineering Physics (China)
Zeren Li, China Academy of Engineering Physics (China)
Qixian Peng, China Academy of Engineering Physics (China)


Published in SPIE Proceedings Vol. 8139:
Advances in X-Ray/EUV Optics and Components VI
Christian Morawe; Ali M. Khounsary; Shunji Goto, Editor(s)

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