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Proceedings Paper

Measurement of lateral chromatic aberration by using an imaging spectrometer
Author(s): Héctor González-Núñez; Xesús Prieto-Blanco; Elena López Lago; M. Dolores Mouriz; Raúl de la Fuente
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Paper Abstract

Lateral chromatic aberration or lateral color refers to the change in image position with wavelength, and so to the change in magnification, at the image plane of an optical system. In an imaging spectrometer, this introduces a slop and/or curvature in the spectral image line of an object point, a feature that is known as keystone. The variation in keystone when the spectrometer is illuminated with and without the optical system under test allows measuring the lateral chromatic aberration in a wide spectral band.

Paper Details

Date Published: 26 July 2011
PDF: 7 pages
Proc. SPIE 8001, International Conference on Applications of Optics and Photonics, 80013G (26 July 2011); doi: 10.1117/12.892093
Show Author Affiliations
Héctor González-Núñez, Univ. of Santiago de Compostela (Spain)
Xesús Prieto-Blanco, Univ. of Santiago de Compostela (Spain)
Elena López Lago, Univ. of Santiago de Compostela (Spain)
M. Dolores Mouriz, Univ. of Santiago de Compostela (Spain)
Raúl de la Fuente, Univ. of Santiago de Compostela (Spain)


Published in SPIE Proceedings Vol. 8001:
International Conference on Applications of Optics and Photonics
Manuel Filipe Costa, Editor(s)

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