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Proceedings Paper

Remote laboratory for digital holographic metrology
Author(s): Marc Wilke; Igor Alekseenko; Guohai Situ; Konica Sarker; Margarita Riedel; Giancarlo Pedrini; Wolfgang Osten
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Paper Abstract

Advances in information technology open up the potential of combining optical systems with net based infrastructures, allowing for remote inspection and virtual metrology. In this paper, we report our recent work on building a remote laboratory for digital holographic metrology. We describe the architecture and the techniques involved in setting up the remote controlling metrology system. Further consideration will be given to the integration into an advanced infrastructure for remote experimentation, data storage and publication. Some other important issues such as information security will not be addressed.

Paper Details

Date Published: 26 May 2011
PDF: 7 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80820D (26 May 2011); doi: 10.1117/12.892073
Show Author Affiliations
Marc Wilke, Univ. Stuttgart (Germany)
Igor Alekseenko, Univ. Stuttgart (Germany)
Guohai Situ, Univ. Stuttgart (Germany)
Konica Sarker, Univ. Stuttgart (Germany)
Margarita Riedel, Univ. Stuttgart (Germany)
Giancarlo Pedrini, Univ. Stuttgart (Germany)
Wolfgang Osten, Univ. Stuttgart (Germany)

Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

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