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Proceedings Paper

Structural and optical characterisation of planar waveguides obtained via Sol-Gel
Author(s): F. Rey-García; C. Gómez-Reino; M. T. Flores-Arias; G. F. De La Fuente; W. Assenmacher; W. Mader
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Paper Abstract

Planar waveguides of SiO2:TiO2 (multilayer structure) and SiO2:CeO2 (thick layer) were prepared onto commercial glass substrates using a sol-gel technique combined with dip-coating. These glassy coatings were structural characterised by Transmission Electron Microscopy (TEM) Energy Dispersive X-ray analysis and by Confocal Microscopy. Thicknesses of 1230 nm and 4,15 μm and refractive indices of 1.59 and 1.48 for SiO2:TiO2 (70:30) and SiO2:CeO2 (95:5) waveguides were obtained, respectively, by Spectroscopic Ellypsometry. Losses of 0.8 dB/cm were measured by double prism method in the SiO2:CeO2 system.

Paper Details

Date Published: 26 July 2011
PDF: 8 pages
Proc. SPIE 8001, International Conference on Applications of Optics and Photonics, 800116 (26 July 2011); doi: 10.1117/12.891941
Show Author Affiliations
F. Rey-García, Univ. de Santiago de Compostela (Spain)
C. Gómez-Reino, Univ. de Santiago de Compostela (Spain)
M. T. Flores-Arias, Univ. de Santiago de Compostela (Spain)
G. F. De La Fuente, Univ. de Zaragoza (Spain)
W. Assenmacher, Univ. Bonn (Germany)
W. Mader, Univ. Bonn (Germany)

Published in SPIE Proceedings Vol. 8001:
International Conference on Applications of Optics and Photonics
Manuel Filipe Costa, Editor(s)

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