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Proceedings Paper

Opto-mechanical force measurement of deep sub-wavelength plasmonic modes
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Paper Abstract

Spatial mapping of optical force near the hot-spot of a metal-dielectric-metal bow-tie nanoantenna at a wavelength of 1550 nm is presented. Non contact mode atomic force microscopy is used with a lock-in method to produce the map. Maxwell's stress tensor method has also been used to simulate the force produced by the bow-tie and it agrees with the experimental data. If dual lock-in amplifiers are used, this method could potentially produce the near field intensity and optical force map simultaneously, both with high spatial resolution. Detailed mapping of the optical force is critical for many emerging applications such as plasmonic biosensing and optomechanical switching.

Paper Details

Date Published: 9 September 2011
PDF: 8 pages
Proc. SPIE 8097, Optical Trapping and Optical Micromanipulation VIII, 80971T (9 September 2011); doi: 10.1117/12.891888
Show Author Affiliations
John Kohoutek, Northwestern Univ. (United States)
Dibyendu Dey, Northwestern Univ. (United States)
Alireza Bonakdar, Northwestern Univ. (United States)
Alejandro Sklar, Northwestern Univ. (United States)
Omer Gokalp Memis, Northwestern Univ. (United States)
Ryan Gelfand, Northwestern Univ. (United States)
Hooman Mohseni, Northwestern Univ. (United States)


Published in SPIE Proceedings Vol. 8097:
Optical Trapping and Optical Micromanipulation VIII
Kishan Dholakia; Gabriel C. Spalding, Editor(s)

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