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Proceedings Paper

Micro-displacement measurement based on electronic speckle
Author(s): Xiaoping Lang; Xiaoying Li
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Paper Abstract

The method to measure micro-displacement based on Electronic Speckle is theoretically analyzed. An interferometer system is set up for measuring in-plane displacement of the measured surface, where the charge-coupled device (CCD) is used for image acquisition. It is well known that there are strong grain-shape random noises in the speckle patterns, which make heavy influence on the visibility and resolution of speckle fringes. Hence the technique of image processing is important to improve the contrast of the speckle fringes. For this reason, good experimental conditions are required to capture better speckle patterns; then image filtering and Fourier transformation are used to process the patterns. It is proved that the method in this paper can effectively improve the measurement results.

Paper Details

Date Published: 26 May 2011
PDF: 6 pages
Proc. SPIE 7997, Fourth International Seminar on Modern Cutting and Measurement Engineering, 79972R (26 May 2011); doi: 10.1117/12.891859
Show Author Affiliations
Xiaoping Lang, Beijing Information Science & Technology Univ. (China)
Xiaoying Li, Beijing Information Science & Technology Univ. (China)


Published in SPIE Proceedings Vol. 7997:
Fourth International Seminar on Modern Cutting and Measurement Engineering
Jiezhi Xin; Lianqing Zhu; Zhongyu Wang, Editor(s)

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