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Proceedings Paper

Investigation on phase compensation method for measurement of resistance of quartz crystal
Author(s): Yanlin Wang; Zhongyu Wang; Dong Li; Guili Liu
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Paper Abstract

Resistance is one of four basic parameters of quartz crystal, and the others can be deducted from it. However, its strict requirements on fabrication technology for π network, and the phase shift induced by tray reactance and quartz crystal static capacitance, the highest accuracy measurements of resistance is difficult to be realized. Here, active compensation to additional-phase offset induced by stray reactance in π network and quartz crystal static capacitance (C0) is presented, which facilitates measurement of resistance of quartz crystal, and reduces the requirements of fabrication technology for π network. The experimental result indicates that the measurement accuracy of resistance R1 in quartz crystal can be up to ±5% with this measurement system.

Paper Details

Date Published: 26 May 2011
PDF: 6 pages
Proc. SPIE 7997, Fourth International Seminar on Modern Cutting and Measurement Engineering, 79971P (26 May 2011); doi: 10.1117/12.891856
Show Author Affiliations
Yanlin Wang, Beihang Univ. (China)
Beijing Information Science & Technology Univ. (China)
Zhongyu Wang, Beihang Univ. (China)
Dong Li, Beijing Information Science & Technology Univ. (China)
Guili Liu, Beijing Information Science & Technology Univ. (China)


Published in SPIE Proceedings Vol. 7997:
Fourth International Seminar on Modern Cutting and Measurement Engineering
Jiezhi Xin; Lianqing Zhu; Zhongyu Wang, Editor(s)

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