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Proceedings Paper

Extremely lightweight x-ray optics based on thin substrates
Author(s): R. Hudec; J. Sik; M. Lorenc; L. Pina; V. Marsikova; M. Mika; A. Inneman; M. Skulinova
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Paper Abstract

We report on recent progress with development of astronomical X-ray optics based on bent Si wafers. Recent efforts with Si wafers have been focused on new forming technologies such as method of deposition of thin layers. The role of substrates quality in performance of final mirror arrays, as required by large future space X-ray astronomy experiments was also studied.

Paper Details

Date Published: 24 May 2011
PDF: 9 pages
Proc. SPIE 8076, EUV and X-Ray Optics: Synergy between Laboratory and Space II, 807604 (24 May 2011); doi: 10.1117/12.890516
Show Author Affiliations
R. Hudec, Astronomical Institute, ASCR (Czech Republic)
Czech Technical Univ. (Czech Republic)
J. Sik, ON Semiconductor Czech Republic (Czech Republic)
M. Lorenc, ON Semiconductor Czech Republic (Czech Republic)
L. Pina, Czech Technical Univ. (Czech Republic)
V. Marsikova, Rigaku Innovative Technologies Europe (Czech Republic)
M. Mika, Institute of Chemical Technology (Czech Republic)
A. Inneman, Rigaku Innovative Technologies Europe (Czech Republic)
M. Skulinova, Astronomical Institute, ASCR (Czech Republic)


Published in SPIE Proceedings Vol. 8076:
EUV and X-Ray Optics: Synergy between Laboratory and Space II
René Hudec; Ladislav Pina, Editor(s)

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