Share Email Print

Proceedings Paper

The design of MTF test system based on point light source
Author(s): Rongguo Fu; Ning Wu; Xinlong Zhang; Yafeng Qiu; Benkang Chang
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In the field of applied optics, the evaluation of imaging quality in optical systems has been a problem of public attention. From the 1970s, with the development of the large-capacity high-speed digital computer and improvement of high-precision optical testing technology, the calculations and measurements of MTF are maturing and began to promote the practical application. After years of development, The MTF has been an important evaluating indicator of image quality of an optical system. A test system of MTF is designed in the paper; theoretical study related to the MTF testing is introduced, such as specifying the physics concept of MTF, summarizing the testing methods of MTF and analyzing the testing principle. On the base of introducing the theory which are related, the framework of system has been established. The devices which are used in the experiment are also introduced. Testing software has been developed. How to manipulate the testing system is introduced and the factors which affect the result are pointed out. The experiment is carried out to measure the optical lens sample in the axis, and the result is given.

Paper Details

Date Published: 27 September 2011
PDF: 10 pages
Proc. SPIE 8126, Optical Manufacturing and Testing IX, 81260Q (27 September 2011); doi: 10.1117/12.890024
Show Author Affiliations
Rongguo Fu, Nanjing Univ. of Science & Technology (China)
Ning Wu, Nanjing Univ. of Science & Technology (China)
Xinlong Zhang, Nanjing Univ. of Science & Technology (China)
Yafeng Qiu, Nanjing Univ. of Science & Technology (China)
Benkang Chang, Nanjing Univ. of Science & Technology (China)

Published in SPIE Proceedings Vol. 8126:
Optical Manufacturing and Testing IX
James H. Burge; Oliver W. Fähnle; Ray Williamson, Editor(s)

© SPIE. Terms of Use
Back to Top