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Proceedings Paper

Recognizing overlapped particles during a crystallization process from in situ video images for measuring their size distributions
Author(s): Ola Suleiman Ahmad; Johan Debayle; Nesrine Gherras; Benoît Presles; Gilles Févotte; Jean-Charles Pinoli
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Paper Abstract

This paper presents a method to recognize polygonal-shaped particles (i.e. rectangles, regular/irregular prisms) among agglomerated crystals from in situ images during a crystallization process. The aim is to measure the particle size distributions (PSD), which are key measurements needed for the purification operations and the quality control of chemical products or drugs. The method is first based on detecting the geometric features of the particles identified by their salient corners. A clustering technique is then applied by grouping three correspondent salient corners belonging to the same polygon. The efficiency of the proposed method is tested on particles of Ammonium Oxalate during batch crystallization in pure water. Particle size distributions are calculated, and a quantitative comparison between automatic and manual sizing is performed.

Paper Details

Date Published: 12 July 2011
PDF: 8 pages
Proc. SPIE 8000, Tenth International Conference on Quality Control by Artificial Vision, 800005 (12 July 2011); doi: 10.1117/12.889915
Show Author Affiliations
Ola Suleiman Ahmad, LPMG, CNRS, Ecole Nationale Supérieure des Mines de Saint-Etienne (France)
Johan Debayle, LPMG, CNRS, Ecole Nationale Supérieure des Mines de Saint-Etienne (France)
Nesrine Gherras, LPMG, CNRS, Ecole Nationale Supérieure des Mines de Saint-Etienne (France)
Benoît Presles, LPMG, CNRS, Ecole Nationale Supérieure des Mines de Saint-Etienne (France)
Gilles Févotte, LPMG, CNRS, Ecole Nationale Supérieure des Mines de Saint-Etienne (France)
Univ. Lyon 1 (France)
Jean-Charles Pinoli, LPMG, CNRS, Ecole Nationale Supérieure des Mines de Saint-Etienne (France)


Published in SPIE Proceedings Vol. 8000:
Tenth International Conference on Quality Control by Artificial Vision
Jean-Charles Pinoli; Johan Debayle; Yann Gavet; Frédéric Gruy; Claude Lambert, Editor(s)

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