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Proceedings Paper

Speckle pattern simulations for in-plane displacement measurements
Author(s): Yves Salvadé; Romain Bonjour
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Paper Abstract

In this paper, we describe a theoretical model, which allows simulating speckle pattern in an imaging system and its detection by an image sensor with a limited number of pixels. This simulation tool is based on the Fourier Optics theory. Preliminary tests show a very good agreement between simulations and experiments. We have demonstrated experimentally and theoretically that sub-micrometer displacement resolution is possible by means of the crosscorrelation of speckle patterns, over a range limited to half of the field-of-view of the imaging system.

Paper Details

Date Published: 23 May 2011
PDF: 7 pages
Proc. SPIE 8083, Modeling Aspects in Optical Metrology III, 80830H (23 May 2011); doi: 10.1117/12.889789
Show Author Affiliations
Yves Salvadé, Haute Ecole Arc Ingénierie Siège (Switzerland)
Romain Bonjour, Haute Ecole Arc Ingénierie Siège (Switzerland)


Published in SPIE Proceedings Vol. 8083:
Modeling Aspects in Optical Metrology III
Bernd Bodermann, Editor(s)

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