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Proceedings Paper

Phase extraction in microscopy using tunable defocusing by means of a SLM
Author(s): Luis Camacho; Vicente Micó; Zeev Zalevsky; Javier García
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Paper Abstract

In many practical microscopy applications the use of phase information is crucial. In this contribution we propose a method for phase extraction in a microscopy system based on analysis of images with varying defocusing. The system has no mobile parts owing to the defocusing by means of a spatial light modulator. The base of the method is the captre of images in a microscope with varying tube lens focal lengths. This produce a set of intensity images, all of them related, because the can be generated by free space propagation of a complex distribution which is unknown.

Paper Details

Date Published: 26 May 2011
PDF: 6 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80820O (26 May 2011); doi: 10.1117/12.889591
Show Author Affiliations
Luis Camacho, Univ. de València (Spain)
Vicente Micó, Univ. de València (Spain)
Zeev Zalevsky, Bar-Ilan Univ. (Israel)
Javier García, Univ. de València (Spain)


Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

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