Share Email Print
cover

Proceedings Paper

Laser induced deflection (LID) method for absolute absorption measurements of optical materials and thin films
Author(s): Christian Mühlig; Simon Bublitz; Wolfgang Paa
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We use optimized concepts to measure directly low absorption in optical materials and thin films at various laser wavelengths by the laser induced deflection (LID) technique. An independent absolute calibration, using electrical heaters, is applied to obtain absolute absorption data without the actual knowledge of the photo-thermal material properties. Verification of the absolute calibration is obtained by measuring different silicon samples at 633 nm where all laser light, apart from the measured reflection/scattering, is absorbed. Various experimental results for bulk materials and thin films are presented including measurements of fused silica and CaF2 at 193 nm, nonlinear crystals (LBO) for frequency conversion and AR coated fused silica for high power material processing at 1030 nm and Yb-doped silica raw materials for high power fiber lasers at 1550 nm. In particular for LBO the need of an independent calibration is demonstrated since thermal lens generation is dominated by stress-induced refractive index change which is in contrast to most of the common optical materials. The measured results are proven by numerical simulations and their influence on the measurement strategy and the obtained accuracy are shown.

Paper Details

Date Published: 27 May 2011
PDF: 12 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 808225 (27 May 2011); doi: 10.1117/12.889468
Show Author Affiliations
Christian Mühlig, Institute of Photonic Technology (Germany)
Simon Bublitz, Institute of Photonic Technology (Germany)
Wolfgang Paa, Institute of Photonic Technology (Germany)


Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

© SPIE. Terms of Use
Back to Top