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Proceedings Paper

Application of wavelet transform and image morphology in processing vibration speckle interferogram for automatic analysis
Author(s): Rajesh Kumar; Dibya Prakash Jena; Chandra Shakher
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Paper Abstract

In automatic analysis of the time-average digital speckle interferogram, the great challenge is to get proper intensity variation between different fringes and smoothness in the line profile of intensity distribution, so as it approaches the governing Bessel function/map. An image processing scheme based on wavelet denoising and morphological operation has been investigated which is very effective in reducing speckle index, width reduction of the bright fringes and in getting proper line profile for intensity distribution. Improvement in signal to noise ratio (i.e. decrease in speckle index) upto 28 times has been observed.

Paper Details

Date Published: 27 May 2011
PDF: 5 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80821Y (27 May 2011); doi: 10.1117/12.889449
Show Author Affiliations
Rajesh Kumar, Sant Longowal Institute of Engineering and Technology (India)
Dibya Prakash Jena, Sant Longowal Institute of Engineering and Technology (India)
Chandra Shakher, Indian Institute of Technology Delhi (India)


Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

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