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Proceedings Paper

A fast target location method for the photogrammetry system
Author(s): Jun Wang; Mingli Dong; Bo Liang
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Paper Abstract

In close range photogrammetry and vision metrology, several images which are taken at different stations are required for high accuracy. Before camera calibration and 3D reconstruction, the targets in the images must be recognized and located with high accuracy firstly. Furthermore, in order to monitor the deformation of the surface, real-time and on-line photogrammetry system is needed, in which high speed is necessary. So, the image processing method and speed will affect the accuracy and speed of the photogrammetry system. This paper describes a fast target location method for the photogrammetry system. Experimental results show that the target edge pixels preserve the important geometric information for subpixel centroid, which can reach accuracies to 2-3% of the pixel size. The process time of an image with 3008x2000 pixels is about 0.1S, much higher than other similar methods.

Paper Details

Date Published: 26 May 2011
PDF: 6 pages
Proc. SPIE 7997, Fourth International Seminar on Modern Cutting and Measurement Engineering, 79972P (26 May 2011); doi: 10.1117/12.889394
Show Author Affiliations
Jun Wang, Beijing Information Science & Technology Univ. (China)
Mingli Dong, Beijing Information Science & Technology Univ. (China)
Bo Liang, Beijing Information Science & Technology Univ. (China)


Published in SPIE Proceedings Vol. 7997:
Fourth International Seminar on Modern Cutting and Measurement Engineering
Jiezhi Xin; Lianqing Zhu; Zhongyu Wang, Editor(s)

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