Share Email Print
cover

Proceedings Paper

Optimization of measuring and calibration procedures for gas analyser based on acousto-optical tunable filters
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

An optimized algorithm of quantitative gas analysis for spectrometers based on acousto-optical tunable filters (AOTFs) is presented. Efficiency of the algorithm is based on unique feature of AOTFs - random spectral access. This property makes it possible utilization of specialized procedures for on-line processing of spectral information without any significant loss of time. The procedure of finding optimal set of spectral points has developed and presented. The optimized algorithm has been tested with use of gas analytical system GAOS comprising movable spectrometer based on double-stage collinear AOTF. GAOS uses differential optical absorption spectroscopy (DOAS) for measuring gases abundance. Optimized algorithm improves the accuracy of the results and reduces measurement time compared to spectral-scanning algorithm. It can be used for such applications as rapid analysis of emissions in emergency, the analysis of large collection of samples in the laboratory or in the production processes, etc. An optimized calibration procedure for gas analyzers employing AOTF-based spectrometers is presented. It takes into account the possible interference of the calibration coefficients of different substances and is insensitive to possible ill-conditioned calibration matrix. Using the optimized calibration procedure allows to reduce the systematic error.

Paper Details

Date Published: 27 May 2011
PDF: 10 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 808242 (27 May 2011); doi: 10.1117/12.889383
Show Author Affiliations
A. V. Fadeyev, Scientific and Technological Ctr. for Unique Instrumentation (Russian Federation)
V. E. Pozhar, Scientific and Technological Ctr. for Unique Instrumentation (Russian Federation)


Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

© SPIE. Terms of Use
Back to Top