Share Email Print
cover

Proceedings Paper

In-process fault detection for textile fabric production: onloom imaging
Author(s): Florian Neumann; Timm Holtermann; Dorian Schneider; Ashley Kulczycki; Thomas Gries; Til Aach
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Constant and traceable high fabric quality is of high importance both for technical and for high-quality conventional fabrics. Usually, quality inspection is carried out by trained personal, whose detection rate and maximum period of concentration are limited. Low resolution automated fabric inspection machines using texture analysis were developed. Since 2003, systems for the in-process inspection on weaving machines ("onloom") are commercially available. With these defects can be detected, but not measured quantitative precisely. Most systems are also prone to inevitable machine vibrations. Feedback loops for fault prevention are not established. Technology has evolved since 2003: Camera and computer prices dropped, resolutions were enhanced, recording speeds increased. These are the preconditions for real-time processing of high-resolution images. So far, these new technological achievements are not used in textile fabric production. For efficient use, a measurement system must be integrated into the weaving process; new algorithms for defect detection and measurement must be developed. The goal of the joint project is the development of a modern machine vision system for nondestructive onloom fabric inspection. The system consists of a vibration-resistant machine integration, a high-resolution machine vision system, and new, reliable, and robust algorithms with quality database for defect documentation. The system is meant to detect, measure, and classify at least 80 % of economically relevant defects. Concepts for feedback loops into the weaving process will be pointed out.

Paper Details

Date Published: 27 May 2011
PDF: 12 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 808240 (27 May 2011); doi: 10.1117/12.889345
Show Author Affiliations
Florian Neumann, RWTH Aachen (Germany)
Timm Holtermann, RWTH Aachen (Germany)
Dorian Schneider, RWTH Aachen (Germany)
Ashley Kulczycki, RWTH Aachen (Germany)
Michigan State Univ. (United States)
Thomas Gries, RWTH Aachen (Germany)
Til Aach, RWTH Aachen (Germany)


Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

© SPIE. Terms of Use
Back to Top