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Proceedings Paper

SLM-based multipoint vibrometry
Author(s): Tobias Haist; Alena Tarbeyevskaya; Michael Warber; Wolfgang Osten; Christian Rembe; Mario Ludwig; Wilhelm Stork
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Paper Abstract

Heterodyne interferometry is a very accurate and robust technique for measuring vibrations under industrial conditions. Typically, instruments based on this principle measure on a single point and scanning is employed to obtain operational deflection shapes. For the simultaneous measurement of vibrations (e.g. to detect transients) it is possible to use a fixed arrangement of measurement beams. Dynamic steering of multiple beams, however, is not easy to achieve. In this contribution we present a solution for multipoint vibrometry using a high resolution (HDTV) programmable spatial light modulator as the core element. By using a liquid crystal display (LCD) for displaying a dynamic hologram it is possible to independently control multiple measurement spots in three dimensions with high repeatability and accuracy. Mechanical movements that might introduce noise do not oocur. The main challenge in designing such an LCD-based multipoint vibrometer is to avoid problems due to the unwanted spurious diffraction orders that will be present when using commercially available spatial light modulators for reconstructing holograms. We present a system in which the illuminating as well as the detection is programmable. One half of the high resolution LCD is used for illumination and the other half is responsible for the detection. Different possible methods to avoid spurious diffraction orders are shortly discussed. Emphasis will be laid on a method based on complex multiplexing (using hologram optimization) and a spatial multiplexing method based on Golay arrays. We show the optical design as well as first experimental results for a single detector. Hologram computation is based on a joint optimization of the detection and the illumination hologram using a modified Gerchberg-Saxton algorithm together with combinatorial optimization of the spot/detector mapping.

Paper Details

Date Published: 27 May 2011
PDF: 9 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80821V (27 May 2011); doi: 10.1117/12.889337
Show Author Affiliations
Tobias Haist, Univ. Stuttgart (Germany)
Alena Tarbeyevskaya, Polytec GmbH (Germany)
Michael Warber, Univ. Stuttgart (Germany)
Wolfgang Osten, Univ. Stuttgart (Germany)
Christian Rembe, Polytec GmbH (Germany)
Mario Ludwig, Polytec GmbH (Germany)
Wilhelm Stork, Karlsruhe Institute of Technology (Germany)


Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

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