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Proceedings Paper

High-sensitivity low-coherence dynamic light scattering and particle sizing for nanoparticles
Author(s): Katsuhiro Ishii; Sohichiro Nakamura; Yuki Sato
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Paper Abstract

We have developed a high-sensitivity, low-coherence dynamic light scattering system for the measurement of particles a few tens of nanometers in size. A Mach-Zehnder interferometer and a confocal optical system were adopted for improved sensitivity to scattered light intensity. The developed system can detect scattered light 3000 times weaker than that detectable by a previous system. We applied the newly developed system to measure the particle size distribution of 10 vol.% polystyrene particles with an average diameter of 13 nm. The obtained particle size distribution agreed quite well with a distribution determined by transmission electron microscopy.

Paper Details

Date Published: 27 May 2011
PDF: 6 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80821Z (27 May 2011); doi: 10.1117/12.889305
Show Author Affiliations
Katsuhiro Ishii, The Graduate School for the Creation of New Photonics Industries (Japan)
Sohichiro Nakamura, FUJIFILM Corp. (Japan)
Yuki Sato, FUJIFILM Corp. (Japan)

Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

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