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Proceedings Paper

13C2H2 stabilized LD at 1542 nm
Author(s): Jin Qian; Chunying Shi; Xiaoping Zhang; Xiuying Liu; Cong Yin
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Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, ; doi: 10.1117/12.889292
Show Author Affiliations
Jin Qian, National Institute of Metrology (China)
Chunying Shi, National Institute of Metrology (China)
Xiaoping Zhang, National Institute of Metrology (China)
Xiuying Liu, National Institute of Metrology (China)
Cong Yin, National Institute of Metrology (China)


Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

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