Share Email Print
cover

Proceedings Paper

Fringe pattern characterization by OPD analysis in a lateral shearing interferometric profilometer
Author(s): María Frade; José María Enguita; Ignacio Álvarez; Silvia Rodríguez-Jiménez
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A common-path interferometric profilometer using a Savart plate as a lateral shearer has been successfully tested under harsh environmental conditions to measure the shape of a surface, detecting defects and characterizing surface properties. The whole profile is obtained from a single image and its depth sensitivity is easily scalable, making this technique suitable for many different applications. Although this system has been successfully used for surface inspection and defect detection, some behaviors cannot be explained by the usual simple model for fringe formation, which, amongst other things, considers normal incidence of the incoming rays into the Savart plate. These deviations from the ideal case are more noticeable for high resolutions from short distances. This paper studies the formation of the fringe pattern, which is crucial for understanding the behavior of the system and proper calibration.

Paper Details

Date Published: 27 May 2011
PDF: 12 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80821S (27 May 2011); doi: 10.1117/12.889267
Show Author Affiliations
María Frade, Univ. of Oviedo (Spain)
José María Enguita, Univ. of Oviedo (Spain)
Ignacio Álvarez, Univ. of Oviedo (Spain)
Silvia Rodríguez-Jiménez, Univ. of Oviedo (Spain)


Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

© SPIE. Terms of Use
Back to Top