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Proceedings Paper

Novel method for misalignments measurement on imaging systems through quality image analysis
Author(s): Esther Oteo; José Fernández-Dorado; J. Arasa; P. Blanco; C. Pizarro
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Paper Abstract

The proper alignment of the individual elements in an optical system is a crucial point in the final performance of an optical system. The developed method we present is aimed to detect and quantify misalignments of decentering and tilt in imaging optical systems with a non-expensive system. This method is based in the comparison of different image parameters values. These parameters values are obtained through the analysis of the image formed by the optical system under study of an object composed of an array of point sources. The method has been validated by obtaining the behavior curves of the parameters for a gauss system in front of decentering up to 0.3mm and tilt up to 1°.

Paper Details

Date Published: 27 May 2011
PDF: 11 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80823C (27 May 2011); doi: 10.1117/12.889248
Show Author Affiliations
Esther Oteo, SnellOptics (Spain)
José Fernández-Dorado, SnellOptics (Spain)
J. Arasa, Technical Univ. of Catalonia (Spain)
P. Blanco, SnellOptics (Spain)
C. Pizarro, Technical Univ. of Catalonia (Spain)


Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

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