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Proceedings Paper

High resolution speckle interferometry by replacing temporal information with spatial information
Author(s): Y. Arai; T. Inoue; S. Yokozeki
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Paper Abstract

Electronic speckle pattern interferometry using virtual speckle patterns is a high resolution deformation measurement method. Usually, virtual speckle patterns have been produced by Hilbert transform or Carré algorithm. However, there are some problems concerning calculating time and quantity of deformation in the process of producing virtual speckle patterns. In proposed method, virtual speckle patterns are easily produced by replacing temporal information with spatial information on CCD without processing by Fourier transform or Carré algorithm. As the results, calculating cost of virtual speckle patterns is improved. It is confirmed that the new method is equal to ordinary methods in measurement accuracy.

Paper Details

Date Published: 27 May 2011
PDF: 8 pages
Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 80821U (27 May 2011); doi: 10.1117/12.889224
Show Author Affiliations
Y. Arai, Kansai Univ. (Japan)
T. Inoue, Kansai Univ. (Japan)
S. Yokozeki, Jyouko Applied Optics Lab. (Japan)


Published in SPIE Proceedings Vol. 8082:
Optical Measurement Systems for Industrial Inspection VII
Peter H. Lehmann; Wolfgang Osten; Kay Gastinger, Editor(s)

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