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Proceedings Paper

Effect of surface roughness on subwavelength imaging with layered metamaterial optical elements
Author(s): T. Stefaniuk; G. Nowak; R. Kotynski
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Paper Abstract

We characterize the influence of surface roughness on resolution and on the transmission coefficient of double layered silver-TiO2 superlenses. Rough surfaces are modelled with a Gaussian statistics based on experimental AFM measurements of e-beam evaporated layers, whereas the rest of the analysis is numerical and is obtained using 2D FDTD. The roughness of a surface is described with the root-mean-square of its height and with the width of its autocorrelation function. Our modelling results confirm that surface roughness is a critical limiting factor for both superresolution and for large transmission efficiency.

Paper Details

Date Published: 18 May 2011
PDF: 9 pages
Proc. SPIE 8070, Metamaterials VI, 807010 (18 May 2011); doi: 10.1117/12.889188
Show Author Affiliations
T. Stefaniuk, Univ. of Warsaw (Poland)
G. Nowak, Institute of High Pressure Physics (Poland)
R. Kotynski, Univ. of Warsaw (Poland)


Published in SPIE Proceedings Vol. 8070:
Metamaterials VI
Vladimir Kuzmiak; Peter Markos; Tomasz Szoplik, Editor(s)

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