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Proceedings Paper

Cryogenic optical testing results of JWST aspheric test plate lens
Author(s): Koby Z. Smith; Timothy C. Towell
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Paper Abstract

The James Webb Space Telescope (JWST) Secondary Mirror Assembly (SMA) is a circular 740mm diameter beryllium convex hyperboloid that has a 23.5nm-RMS (λ/27 RMS) on-orbit surface figure error requirement. The radius of curvature of the SMA is 1778.913mm±0.45mm and has a conic constant of -1.6598±0.0005. The on-orbit operating temperature of the JWST SMA is 22.5K. Ball Aerospace & Technologies Corp. (BATC) is under contract to Northrop Grumman Aerospace Systems (NGAS) to fabricate, assemble, and test the JWST SMA to its on-orbit requirements including the optical testing of the SMA at its cryogenic operating temperature. BATC has fabricated and tested an Aspheric Test Plate Lens (ATPL) that is an 870mm diameter fused silica lens used as the Fizeau optical reference in the ambient and cryogenic optical testing of the JWST Secondary Mirror Assembly (SMA). As the optical reference for the SMA optical test, the concave optical surface of the ATPL is required to be verified at the same 20K temperature range required for the SMA. In order to meet this objective, a state-of-the-art helium cryogenic testing facility was developed to support the optical testing requirements of a number of the JWST optical testing needs, including the ATPL and SMA. With the implementation of this cryogenic testing facility, the ATPL was successfully cryogenically tested and performed to less than 10nm-RMS (λ/63 RMS) surface figure uncertainty levels for proper reference backout during the SMA optical testing program.

Paper Details

Date Published: 27 September 2011
PDF: 12 pages
Proc. SPIE 8126, Optical Manufacturing and Testing IX, 81260O (27 September 2011); doi: 10.1117/12.889150
Show Author Affiliations
Koby Z. Smith, Ball Aerospace & Technologies Corp. (United States)
Timothy C. Towell, Ball Aerospace & Technologies Corp. (United States)


Published in SPIE Proceedings Vol. 8126:
Optical Manufacturing and Testing IX
James H. Burge; Oliver W. Fähnle; Ray Williamson, Editor(s)

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