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Proceedings Paper

Impacts and mitigation strategies of sun exposure on uncooled microbolometer image sensors
Author(s): David A. Dorn; Oscar Herrera; Curtis Tesdahl; Eric Shumard; Yu-Wei Wang
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Paper Abstract

This paper provides results from testing and analysis of sun exposure effects on amorphous silicon (α-Si) microbolometers and vanadium oxide (VOX) microbolometers. Gain and offset changes for each detector type is provided. Results from different sun exposure levels corresponding to different geographic locations and time of year are presented. Data associated with increasing exposure duration and number of exposures is presented. The time constants associated with the sun exposure effects are also provided. Potential mitigation processes and algorithms are explored reducing the impact on image quality. The effectiveness of mitigation processes and algorithms is presented.

Paper Details

Date Published: 21 May 2011
PDF: 10 pages
Proc. SPIE 8012, Infrared Technology and Applications XXXVII, 80123Z (21 May 2011); doi: 10.1117/12.888859
Show Author Affiliations
David A. Dorn, Schneider Electric (United States)
Oscar Herrera, Schneider Electric (United States)
Curtis Tesdahl, Schneider Electric (United States)
Eric Shumard, Schneider Electric (United States)
Yu-Wei Wang, Schneider Electric (United States)

Published in SPIE Proceedings Vol. 8012:
Infrared Technology and Applications XXXVII
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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