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Proceedings Paper

Multi-band pyrometer uncertainty analysis and improvement
Author(s): Yongjun Yang; Xuecong Zhang; Jing Cai; Zhongyu Wang
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Paper Abstract

According to the energy ratio value of multi-band radiating from the measured surface, the 'true' temperature can be calculated by multi-band pyrometer. Multi-band pyrometer has many advantages: it can hardly be affected by the emission of measured surface and the environment radiation, and it has higher Signal-to-Noise Ratio and higher temperature measurement accuracy. This paper introduces the principle of a multi-band pyrometer and the uncertainty of measurement result is evaluated by using Monte-Carlo Method (MCM). The result shows that the accuracy of effective wavelength is the largest source of uncertainty and the other main source is reference temperature. When using ordinary blackbody furnace with continuous temperature, which can provide reference temperature and calibrate effective wavelength, the uncertainty component is 2.17K and 2.48K respectively. The combined standard uncertainty is 3.30K. A new calibration method is introduced. The effective wavelength is calibrated by monochromator, and the reference temperature is provided by fixed point black body furnace. The uncertainty component is decreased to 0.73K and 0.12K respectively. The measurement uncertainty is decreased to 0.74K. The temperature measurement accuracy is enhanced.

Paper Details

Date Published: 26 May 2011
PDF: 6 pages
Proc. SPIE 7997, Fourth International Seminar on Modern Cutting and Measurement Engineering, 79971O (26 May 2011); doi: 10.1117/12.888618
Show Author Affiliations
Yongjun Yang, Beihang Univ. (China)
Beijing Changcheng Institute of Metrology and Measurement (China)
Xuecong Zhang, Beijing Changcheng Institute of Metrology and Measurement (China)
Jing Cai, Beijing Changcheng Institute of Metrology and Measurement (China)
Zhongyu Wang, Beihang Univ. (China)


Published in SPIE Proceedings Vol. 7997:
Fourth International Seminar on Modern Cutting and Measurement Engineering
Jiezhi Xin; Lianqing Zhu; Zhongyu Wang, Editor(s)

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