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Proceedings Paper

Analysis of the stress-optical effects in silica-on-silicon optical waveguides
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Paper Abstract

Stress-induced birefringence in silica-on-silicon waveguides is analyzed by the finite element method using the normalized plane strain model. The simulation results show that the thermal expansion coefficient of the upper-cladding is the most critical factor. A waveguide with zero birefringence is obtained and used to realize polarization independent AWGs.

Paper Details

Date Published: 19 January 2011
PDF: 7 pages
Proc. SPIE 7986, Passive Components and Fiber-Based Devices VII, 798611 (19 January 2011); doi: 10.1117/12.888431
Show Author Affiliations
Tingting Lang, China Jiliang Univ. (China)
Zhejiang Univ. (China)
Jingguo Kuang, Zhejiang Univ. (China)
Xufeng Lin, Zhejiang Univ. (China)

Published in SPIE Proceedings Vol. 7986:
Passive Components and Fiber-Based Devices VII
Perry P. Shum, Editor(s)

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