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Proceedings Paper

Research on the reflection coating at three wavelengths for primary reflector of the optical antenna in the laser communication systems
Author(s): Huasong Liu; Muxiao Liu; Zhanshan Wang; Yiqin Ji; Jiangtao Lu
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Paper Abstract

Primary reflector of the optical antenna is a key component in the space laser communication systems, and multi-wavelengths laser need to be worked in the common aperture. Reflection coating is designed for the primary reflector of a laser communication system, which can work at three wavelengths (633nm, 808nm, 1550nm), the designed target reflectance are R633nm≥50%, R808nm≥99% and R1550nm≥99% at angle of incidence from 0 to 20 deg. We selected Ta2O5 and SiO2 as the high refractive index and low refractive index coating materials, analyzed the impact on the reflection coating of the systemic errors and random errors, and determined the manufacture error of the coater system which can't greater than 1%. The Ion beam sputtering deposition technique was used to manufacture reflection coating for three-wavelengths and a LAMBDA900 spectrophotometer was used to analysis the reflectance at three wavelengths which achieved the design requirements. Finally we give the origin of manufacture error source for this high reflection coating. The reflection coating component was successfully used in the primary reflector of the optical antenna of the laser communication systems.

Paper Details

Date Published: 18 February 2011
PDF: 4 pages
Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 79950N (18 February 2011); doi: 10.1117/12.888406
Show Author Affiliations
Huasong Liu, Tongji Univ. (China)
Jinhang Institute of Technical Physics (China)
Muxiao Liu, Jinhang Institute of Technical Physics (China)
Zhanshan Wang, Tongji Univ. (China)
Yiqin Ji, Jinhang Institute of Technical Physics (China)
Harbin Institute of Technology (China)
Jiangtao Lu, Tongji Univ. (China)


Published in SPIE Proceedings Vol. 7995:
Seventh International Conference on Thin Film Physics and Applications
Junhao Chu; Zhanshan Wang, Editor(s)

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