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Proceedings Paper

Growth orientation and surface morphology of CeO2 films for high-Jc YBCO films on biaxially textured Ni tape by PLD
Author(s): Huaran Liu; Linfei Liu; Xiaokun Song; Dan Hong; Ying Wang; Yijie Li
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Paper Abstract

Epitaxial cerium oxide buffer layers were deposited on biaxially-textured (001) Ni tape using reel-to-reel pulsed laser deposition in a vacuum chamber. Relationship between microstructure and deposition parameters was systematically studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), and atomic force microscopy (AFM). We found the optimal deposition parameters for CeO2 buffer layer which were quite suitable for preparing high-Jc YBCO films. The relationship between CeO2 layer thickness and crack formation has also been discussed.

Paper Details

Date Published: 18 February 2011
PDF: 4 pages
Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 799521 (18 February 2011); doi: 10.1117/12.888280
Show Author Affiliations
Huaran Liu, Shanghai Jiao Tong Univ. (China)
Linfei Liu, Shanghai Jiao Tong Univ. (China)
Xiaokun Song, Shanghai Jiao Tong Univ. (China)
Dan Hong, Shanghai Jiao Tong Univ. (China)
Ying Wang, Shanghai Jiao Tong Univ. (China)
Yijie Li, Shanghai Jiao Tong Univ. (China)


Published in SPIE Proceedings Vol. 7995:
Seventh International Conference on Thin Film Physics and Applications
Junhao Chu; Zhanshan Wang, Editor(s)

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