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Proceedings Paper

Effects of texture on the properties of polycrystalline HgI2 films
Author(s): Weimin Shi; Qingfeng Su; Dongmin Li; Linjun Wang; Haokun Hu; Yiben Xia
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Paper Abstract

Due to different oriented polycrystalline HgI2 films show different properties. In this paper the properties of different oriented HgI2 films have been investigated by scanning electron microscopy, X-ray diffraction and current-voltage measurements. The measured results indicate HgI2 films are of high quality and the properties of the (001)-oriented HgI2 film are better than those of the free oriented ones. The dark current of the (001)-oriented HgI2 film is 0.5 nA with an applied bias voltage of 40 V. The current of (001)-oriented HgI2 film keeps unchanged during measurement.

Paper Details

Date Published: 18 February 2011
PDF: 4 pages
Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 79951L (18 February 2011); doi: 10.1117/12.888212
Show Author Affiliations
Weimin Shi, Shanghai Univ. (China)
Qingfeng Su, Shanghai Univ. (China)
Shanghai New Energy S&T Co. Ltd. (China)
Dongmin Li, Shanghai Westingarea M&E System Co. Ltd. (China)
Linjun Wang, Shanghai Univ. (China)
Haokun Hu, Shanghai Univ. (China)
Yiben Xia, Shanghai Univ. (China)

Published in SPIE Proceedings Vol. 7995:
Seventh International Conference on Thin Film Physics and Applications
Junhao Chu; Zhanshan Wang, Editor(s)

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