Share Email Print
cover

Proceedings Paper

High precision deposition of single and multilayer x-ray optics and their application in x-ray analysis
Author(s): R. Dietsch; T. Holz; M. Krämer; D. Weißbach
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The field of single and multilayer based optics has seen significant improvements and new applications in recent years. In this paper, we give an overview of the numerous types of single and multilayer optics that have been developed. The fabrication possibilities of well-known regular periodic multilayers have been driven close to the theoretical limit, providing high resolution or high flux optics for a wide range of photon energies. In addition to that, multilayers with a lateral gradient have been developed to be adapted to curved substrates (for example for focusing purposes) or varying incidence angles on long, flat substrates. Depth-graded multilayers with arbitrarily selectable layer thicknesses over the entire layer stack have been simulated and manufactured, mainly as broadband mirrors with immense bandwidths. Finally, new applications of high precision deposition are reference sample for XRF (having several elements in low concentrations of few ng/mm2) and TXRF (with mass deposition in the range of 1011 atoms/cm2) pay tribute to the low detection limits achievable in modern instruments for these techniques.

Paper Details

Date Published: 18 February 2011
PDF: 6 pages
Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 79951U (18 February 2011); doi: 10.1117/12.888192
Show Author Affiliations
R. Dietsch, AXO DRESDEN GmbH (Germany)
T. Holz, AXO DRESDEN GmbH (Germany)
M. Krämer, AXO DRESDEN GmbH (Germany)
D. Weißbach, AXO DRESDEN GmbH (Germany)


Published in SPIE Proceedings Vol. 7995:
Seventh International Conference on Thin Film Physics and Applications
Junhao Chu; Zhanshan Wang, Editor(s)

© SPIE. Terms of Use
Back to Top