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Proceedings Paper

Application possibilities of several modern methods of microscopy and microanalysis in forensic science field
Author(s): Marek Kotrly; Ivana Turkova
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Paper Abstract

The methods of optical and electron microscopy and microanalysis are the linchpin of forensic inorganic analysis. However, their capacity is limited as for the exact identification of pigments and colour layers, and therefore it is essential that they be complemented by other methods of phase microanalysis - powder X-ray microdiffraction (micro pXRD) and FTIR in transmission mode. The classic way of sample division for different methods is not suitable with regard to the inhomogeneity of the sequence of strata. That is why a method was tested that would allow performance of optical microscopy, SEM/EDS(WDS), micro pXRD and FTIR in a nondestructive manner, from an identical spot of a single fragment. The solution can be polished sections - embedded samples and microtome sections. Conductive zerobackground single-crystal silicon plates were developed and tested for sample fixation in SEM, micro pXRD and transmission FTIR. Methods using a focused ion beam - FIB have recently gained importance in the field of electron microscopy. In the forensic sphere they can be employed in examinations of metal materials, technical analyses of documents, post-blast and gunshot residues.

Paper Details

Date Published: 11 May 2011
PDF: 6 pages
Proc. SPIE 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 803608 (11 May 2011); doi: 10.1117/12.887850
Show Author Affiliations
Marek Kotrly, Institute of Criminalistics Prague (Czech Republic)
Ivana Turkova, Institute of Criminalistics Prague (Czech Republic)


Published in SPIE Proceedings Vol. 8036:
Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Tim K. Maugel, Editor(s)

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