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Proceedings Paper

New approach to noise factor measurement on microchannel plate of optoelectronic detector
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Paper Abstract

The micro-channel plate (MCP) is an important part to imaging quality of image intensifier. In order to obtained high quality of optoelectronic image devices, the microchannel plate (MCP) should be evaluated before assembled in the devices. A new method for noise power factor determination of MCP is described in this paper. The measurements are in accordance with theory and experiments reported. The system consists of vacuum chamber, electron gun, high voltage supply, imaging luminance meter, control units, signal processing circuit, A/D converter, D/A converter, communication unit, industrial computer and measurement software.

Paper Details

Date Published: 16 September 2011
PDF: 6 pages
Proc. SPIE 8155, Infrared Sensors, Devices, and Applications; and Single Photon Imaging II, 81550K (16 September 2011); doi: 10.1117/12.887709
Show Author Affiliations
Lei Liu, Nanjing Univ. of Science & Technology (China)
Yunsheng Qian, Nanjing Univ. of Science & Technology (China)
Yafeng Qiu, Nanjing Univ. of Science & Technology (China)


Published in SPIE Proceedings Vol. 8155:
Infrared Sensors, Devices, and Applications; and Single Photon Imaging II
Manijeh Razeghi; Paul D. LeVan; Ashok K. Sood; Priyalal S. Wijewarnasuriya, Editor(s)

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