Share Email Print
cover

Proceedings Paper

Scientific working group on gunshot residue (SWGGSR): a progress report
Author(s): Michael A. Trimpe
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Scientific Working Group on Gunshot Residue (SWGGSR) was founded in 2007. Twenty-four experienced and well-recognized scientists throughout the world are working toward internationally accepted guidelines in the analysis of gunshot residue. With this goal in mind the group has set up specific committees to cogitate and develop recommendations in key areas of gunshot residue analysis. The SWGGSR meets annually and is in constant contact throughout the year via email. In 2007 SWGGSR assumed responsibility for updating ASTM E-1588 the Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive Xray Spectrometry. In 2010 a revised E-1588 was published. The SWGGSR is currently working on a more comprehensive guide that will be published through NIJ (National Institute of Justice) and available for free to everyone in the world. In addition, we have attended meetings hosted by the federal government's SoFs (Subcommittee on Forensic Science) IWG (Interagency Working Groups) to insure our input on the future of forensic science in the Untied States.

Paper Details

Date Published: 7 June 2011
PDF: 3 pages
Proc. SPIE 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 803606 (7 June 2011); doi: 10.1117/12.887503
Show Author Affiliations
Michael A. Trimpe, Hamilton County Coroner's Lab. (United States)


Published in SPIE Proceedings Vol. 8036:
Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
Michael T. Postek; Dale E. Newbury; S. Frank Platek; David C. Joy; Tim K. Maugel, Editor(s)

© SPIE. Terms of Use
Back to Top