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Proceedings Paper

Rapid beamsteering reflectarrays for mm-wave and submm-wave imaging radars
Author(s): Arttu Luukanen; Juha Ala-Laurinaho; David Gomes Martins; Janne Häkli; Päivi Koivisto; Pekka Pursula; Pekka Rantakari; Jussi Säily; Aleksi Tamminen; Reijo Tuovinen; Markku Sipilä
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Paper Abstract

Recent developments in millimetre to submillimetre-wave imaging radars with excellent ranging resolution provide an attractive route towards stand-off imaging of concealed explosives at ranges up to several tens of meters. Present systems typically rely on only one transceiver, coupled with an optomechanical scanning system for image formation. This limits the image acquisition speed to several seconds/frame. Frame rate can in principle be increased with increasing the channel count but this adds substantially to the system complexity and cost, while only providing a modest speed increase. In this paper we present preliminary designs for rapid electronic beam steering system that could provide a way towards real-time millimetre-wave to submillimetre-wave imaging radars.

Paper Details

Date Published: 26 May 2011
PDF: 10 pages
Proc. SPIE 8022, Passive Millimeter-Wave Imaging Technology XIV, 80220M (26 May 2011); doi: 10.1117/12.887068
Show Author Affiliations
Arttu Luukanen, VTT Technical Research Ctr. of Finland (Finland)
Juha Ala-Laurinaho, Aalto Univ. (Finland)
David Gomes Martins, VTT Technical Research Ctr. of Finland (Finland)
Janne Häkli, VTT Technical Research Ctr. of Finland (Finland)
Päivi Koivisto, VTT Technical Research Ctr. of Finland (Finland)
Pekka Pursula, VTT Technical Research Ctr. of Finland (Finland)
Pekka Rantakari, VTT Technical Research Ctr. of Finland (Finland)
Jussi Säily, VTT Technical Research Ctr. of Finland (Finland)
Aleksi Tamminen, Aalto Univ. (Finland)
Reijo Tuovinen, VTT Technical Research Ctr. of Finland (Finland)
Markku Sipilä, VTT Technical Research Ctr. of Finland (Finland)


Published in SPIE Proceedings Vol. 8022:
Passive Millimeter-Wave Imaging Technology XIV
David A. Wikner; Arttu R. Luukanen, Editor(s)

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