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Proceedings Paper

Multispectral polarized scene projector (MPSP)
Author(s): Haiping Yu; Hong Wei; Lei Guo; Shenggang Wang; Le Li; Jack R Lippert; Steve Serati; Neelam Gupta; Frank R Carlen
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Paper Abstract

This newly developed prototype Multispectral Polarized Scene Projector (MPSP), configured for the short wave infrared (SWIR) regime, can be used for the test & evaluation (T&E) of spectro-polarimetric imaging sensors. The MPSP system generates both static and video images (up to 200 Hz) with 512×512 spatial resolution with active spatial, spectral, and polarization modulation with controlled bandwidth. It projects input SWIR radiant intensity scenes from stored memory with user selectable wavelength (850-1650 nm) and bandwidth (12-100 nm), as well as polarization states (six different states) controllable on a pixel by pixel basis. The system consists of one spectrally tunable liquid crystal filter with variable bandpass, and multiple liquid crystal on silicon (LCoS) spatial light modulators (SLMs) for intensity control and polarization modulation. In addition to the spectro-polarimetric sensor test, the instrument also simulates polarized multispectral images of military scenes/targets for hardware-in-the loop (HIL) testing.

Paper Details

Date Published: 13 May 2011
PDF: 12 pages
Proc. SPIE 8015, Technologies for Synthetic Environments: Hardware-in-the-Loop XVI, 801506 (13 May 2011); doi: 10.1117/12.887028
Show Author Affiliations
Haiping Yu, Kent Optronics, Inc. (United States)
Hong Wei, Kent Optronics, Inc. (United States)
Lei Guo, Kent Optronics, Inc. (United States)
Shenggang Wang, Kent Optronics, Inc. (United States)
Le Li, Kent Optronics, Inc. (United States)
Jack R Lippert, Kent Optronics, Inc. (United States)
Steve Serati, Boulder Nonlinear Systems (United States)
Neelam Gupta, U.S. Army Research Lab. (United States)
Frank R Carlen, U.S. Army Aberdeen Test Ctr. (United States)


Published in SPIE Proceedings Vol. 8015:
Technologies for Synthetic Environments: Hardware-in-the-Loop XVI
Scott B. Mobley, Editor(s)

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