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Proceedings Paper

Compressive sampling in passive millimeter-wave imaging
Author(s): N. Gopalsami; T. W. Elmer; S. Liao; R. Ahern; A. Heifetz; A. C. Raptis; M. Luessi; D. Babacan; A. K. Katsaggelos
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Paper Abstract

We present a Hadamard transform based imaging technique and have implemented it on a single-pixel passive millimeter-wave imager in the 146-154 GHz range. The imaging arrangement uses a set of Hadamard transform masks of size p x q at the image plane of a lens and the transformed image signals are focused and collected by a horn antenna of the imager. The cyclic nature of Hadamard matrix allows the use of a single extended 2-D Hadamard mask of size (2p-1) x (2q-1) to expose a p x q submask for each acquisition by raster scanning the large mask one pixel at a time. A total of N = pq acquisitions can be made with a complete scan. The original p x q image may be reconstructed by a simple matrix operation. Instead of full N acquisitions, we can use a subset of the masks for compressive sensing. In this regard, we have developed a relaxation technique that recovers the full Hadamard measurement space from sub-sampled Hadamard acquisitions. We have reconstructed high fidelity images with 1/9 of the full Hadamard acquisitions, thus reducing the image acquisition time by a factor of 9.

Paper Details

Date Published: 26 May 2011
PDF: 6 pages
Proc. SPIE 8022, Passive Millimeter-Wave Imaging Technology XIV, 80220I (26 May 2011); doi: 10.1117/12.886998
Show Author Affiliations
N. Gopalsami, Argonne National Lab. (United States)
T. W. Elmer, Argonne National Lab. (United States)
S. Liao, Argonne National Lab. (United States)
R. Ahern, Argonne National Lab. (United States)
A. Heifetz, Argonne National Lab. (United States)
A. C. Raptis, Argonne National Lab. (United States)
M. Luessi, Northwestern Univ. (United States)
D. Babacan, Northwestern Univ. (United States)
A. K. Katsaggelos, Northwestern Univ. (United States)


Published in SPIE Proceedings Vol. 8022:
Passive Millimeter-Wave Imaging Technology XIV
David A. Wikner; Arttu R. Luukanen, Editor(s)

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