
Proceedings Paper
Mechanical properties of 1 um-thick metallic freestanding coatings measured by in-plane uniaxial stressFormat | Member Price | Non-Member Price |
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Paper Abstract
The mechanical properties of two aluminium thin films manufactured by two different laboratories were investigated
using in-plane uniaxial tensile stress. The geometrical parameters, in particular film thickness, were accurately measured
and their influences on the mechanical properties were analyzed. The specimens provided by each supplier show
significant differences of their mechanical properties. In the same way, annealing was performed on a specific set of
specimens and its influence on the mechanical properties is highlighted and discussed.
Paper Details
Date Published: 5 May 2011
PDF: 8 pages
Proc. SPIE 8066, Smart Sensors, Actuators, and MEMS V, 806609 (5 May 2011); doi: 10.1117/12.886879
Published in SPIE Proceedings Vol. 8066:
Smart Sensors, Actuators, and MEMS V
Ulrich Schmid; José Luis Sánchez-Rojas; Monika Leester-Schaedel, Editor(s)
PDF: 8 pages
Proc. SPIE 8066, Smart Sensors, Actuators, and MEMS V, 806609 (5 May 2011); doi: 10.1117/12.886879
Show Author Affiliations
Thibaut Fourcade, NOVA MEMS (France)
CNES (France)
Univ. de Toulouse (France)
Cedric Seguineau, NOVA MEMS (France)
Jean Michel Desmarres, CNES (France)
Talal Masri, Univ. de Toulouse (France)
CNES (France)
Univ. de Toulouse (France)
Cedric Seguineau, NOVA MEMS (France)
Jean Michel Desmarres, CNES (France)
Talal Masri, Univ. de Toulouse (France)
Joël Alexis, Univ. de Toulouse (France)
Olivier Dalverny, Univ. de Toulouse (France)
Julien Martegoutte, CNES (France)
Univ. de Toulouse (France)
INL, CNRS, INSA de Lyon (France)
Xavier Lafontan, NOVA MEMS (France)
Olivier Dalverny, Univ. de Toulouse (France)
Julien Martegoutte, CNES (France)
Univ. de Toulouse (France)
INL, CNRS, INSA de Lyon (France)
Xavier Lafontan, NOVA MEMS (France)
Published in SPIE Proceedings Vol. 8066:
Smart Sensors, Actuators, and MEMS V
Ulrich Schmid; José Luis Sánchez-Rojas; Monika Leester-Schaedel, Editor(s)
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