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Proceedings Paper

Optoelectronic phase noise system designed for microwaves photonics sources measurements in metrology application
Author(s): Patrice Salzenstein; Nathalie Cholley; Mikhail Zarubin; Ekaterina Pavlyuchenko; Abdelhamid Hmima; Yanne K. Chembo; Laurent Larger
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Paper Abstract

The performance advances in communication systems like Radar system, precision navigation, space application and time and frequency metrology require more stable frequency and low phase noise system. Here is presented a configuration of phase noise measurement system operating in X- band using a photonic delay line as a frequency discriminator. This system doesn't need any excellent frequency reference and works for any frequency between 8.2 and 12.4 GHz. Using cross correlation on 500 averages, noise floor of the instrument is respectively -150 and -170 dBc/Hz at 101 and 104 Hz from the 10 GHz carrier (-90 and -170 dBc/Hz including 2 km delay lines). This instrument is developed in the context of association with the national french metrology institute (laboratoire national de métrologie et d'essais, LNE). This calibration system is to be integrated in measurements means of the accredited laboratory to improve the Calibration Metrology Capabilities (CMC) of the LNE.

Paper Details

Date Published: 18 May 2011
PDF: 5 pages
Proc. SPIE 8071, Nonlinear Optics and Applications V, 807111 (18 May 2011); doi: 10.1117/12.886694
Show Author Affiliations
Patrice Salzenstein, FEMTO-ST, CNRS (France)
LNE-LTFB (France)
Nathalie Cholley, FEMTO-ST, CNRS (France)
LNE-LTFB (France)
Mikhail Zarubin, FEMTO-ST, CNRS (France)
Ekaterina Pavlyuchenko, FEMTO-ST, CNRS (France)
Abdelhamid Hmima, FEMTO-ST, CNRS (France)
Yanne K. Chembo, FEMTO-ST, CNRS (France)
Laurent Larger, FEMTO-ST, CNRS (France)

Published in SPIE Proceedings Vol. 8071:
Nonlinear Optics and Applications V
Mario Bertolotti, Editor(s)

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