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Proceedings Paper

High-sensitivity temperature sensor with calibration against temperature of a real object
Author(s): Galina Yu. Sotnikova; Sergey E. Aleksandrov; Gennadiy A. Gavrilov; Vladimir V. Zabrodskiy; Vladislav L. Suchanov
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Paper Abstract

This work presents a pyrometer for measurement of temperature of a substrate surface during the MBE growth of semiconductor heterostructures. The pyrometer sensor is based on a high-sensitivity low-noise photodiode sensor representing a microassemblage of a Si p-i-n photodiode with an electronic signal processing scheme using time-pulse modulation. The basic advantage of the proposed pyrometer is its high sensitivity, accuracy (not worse than 1.5oC ) and reproducibility within the temperature interval 450-1200 oC for the operation speed 0.001-1 s under the condition of changing transmission of a vacuum chamber observation (pyrometric) window by up to 10 times. High accuracy and reproducibility of results has been achieved due to implementing the calibration principle against characteristic temperature points inherent in an object and received in situ on indirect measurements.

Paper Details

Date Published: 9 May 2011
PDF: 10 pages
Proc. SPIE 8073, Optical Sensors 2011; and Photonic Crystal Fibers V, 80731D (9 May 2011); doi: 10.1117/12.886351
Show Author Affiliations
Galina Yu. Sotnikova, Ioffe Physical-Technical Institute of the Russian Academy of Sciences (Russian Federation)
Sergey E. Aleksandrov, Ioffe Physical-Technical Institute of the Russian Academy of Sciences (Russian Federation)
Gennadiy A. Gavrilov, Ioffe Physical-Technical Institute of the Russian Academy of Sciences (Russian Federation)
Vladimir V. Zabrodskiy, Ioffe Physical-Technical Institute of the Russian Academy of Sciences (Russian Federation)
Vladislav L. Suchanov, Ioffe Physical-Technical Institute of the Russian Academy of Sciences (Russian Federation)


Published in SPIE Proceedings Vol. 8073:
Optical Sensors 2011; and Photonic Crystal Fibers V
Kyriacos Kalli; Francesco Baldini; Jiri Homola; Robert A. Lieberman, Editor(s)

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