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Proceedings Paper • Open Access

Front Matter: Volume 7855
Author(s): Proceedings of SPIE

Paper Abstract

This PDF file contains the front matter associated with SPIE Proceedings Volume 7855, including the Title Page, Copyright information, Table of Contents, and the Conference Committee listing.

Paper Details

Date Published: 9 December 2010
PDF: 12 pages
Proc. SPIE 7855, Optical Metrology and Inspection for Industrial Applications, 785501 (9 December 2010); doi: 10.1117/12.886292
Show Author Affiliations
Proceedings of SPIE, SPIE (United States)


Published in SPIE Proceedings Vol. 7855:
Optical Metrology and Inspection for Industrial Applications
Kevin Harding; Peisen S. Huang; Toru Yoshizawa, Editor(s)

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