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Proceedings Paper

Distance displacement measurement with two-photon absorption process in Si-APD and high-speed optical millimeter wave scanner
Author(s): Yosuke Tanaka; Daichi Meguro; Naofumi Endo; Takashi Kurokawa
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Paper Abstract

A high-speed optical millimeter wave scanner has been developed and introduced into the distance displacement measurement based on two-photon absorption (TPA) process in a Si-APD. The TPA-based distance displacement measurement can measure the displacement of an object at 10 mm to 10 km away in principle. The measurement for the long distance of 10 m to 10 km was already realized by using intensity modulated light with a modulation frequency range of 10 GHz in the last study. The high-speed optical millimeter wave scanner developed in this study scanned over 100 GHz in 10 ms at its highest speed. We have successfully measured the short distance of 10 mm with a data acquisition time of 1 s and an accuracy of 6.34×10-3 .

Paper Details

Date Published: 17 May 2011
PDF: 4 pages
Proc. SPIE 7753, 21st International Conference on Optical Fiber Sensors, 77534U (17 May 2011); doi: 10.1117/12.885969
Show Author Affiliations
Yosuke Tanaka, Tokyo Univ. of Agriculture and Technology (Japan)
Daichi Meguro, Tokyo Univ. of Agriculture and Technology (Japan)
Naofumi Endo, Tokyo Univ. of Agriculture and Technology (Japan)
Takashi Kurokawa, Tokyo Univ. of Agriculture and Technology (Japan)


Published in SPIE Proceedings Vol. 7753:
21st International Conference on Optical Fiber Sensors
Jacques Albert; Wojtek J. Bock, Editor(s)

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