Share Email Print
cover

Proceedings Paper

Infrared lock-in techniques for solar cell inspection
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Infrared active-source lock-in techniques are used for a variety of solar cell inspections, including electro- and photoluminescence, carrier density imaging, shunt imaging and physical defects. The principles and power of the lock-in technique are reviewed for these inspection methods. Different camera types, including NIR, MW and LW, are available for the different techniques. A selection of excitation sources--electrical, laser, lamp and mechanical-stimulate different physical phenomena. Measurements are presented of several manufacturing yield limiting parameters, and the advantages and limitations of the techniques are discussed.

Paper Details

Date Published: 10 May 2011
PDF: 10 pages
Proc. SPIE 8013, Thermosense: Thermal Infrared Applications XXXIII, 80130L (10 May 2011); doi: 10.1117/12.885953
Show Author Affiliations
Ralph A. Rotolante, MoviTherm (United States)
Bill Schneider, FLIR Systems, Inc. (United States)


Published in SPIE Proceedings Vol. 8013:
Thermosense: Thermal Infrared Applications XXXIII
Morteza Safai; Jeff R. Brown, Editor(s)

© SPIE. Terms of Use
Back to Top