Share Email Print
cover

Proceedings Paper

Factorial tests for the air beam assisted form error in-process optical measurement
Author(s): Y. Zhang; Y. Gao; K. Li
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Form error in-process optical measurement is to provide feedback during a machining process for precision control. Based on the method of water beam assisted form error in-process optical measurement, a new air beam approach was proposed to solve the problems of coolant dilution and optical transmittance through multiple media. In order to identify key parameters to reduce the workload of experimental tests, a factorial test was conducted on transparent window size At and stability est. Calibration and assessment of At and est were introduced. Factorial test design was also examined. Results of the study show that vt, va, and da are the key parameters on At. Although all 6 main parameters are not significant, vt is relatively more important on est. When vt increases, At will decrease. When va or da increases, At will increase. The findings agree with our understanding of the physical process of fluid flow. When vt decreases, the transparent window size stability est will be better. Consider both stability est and air velocity va, Run 11 should be the best choice of conditions for At. A larger transparent window size At typically gives better transparent window size stability est. To achieve a balance between est and va, a suitable size of transparent window at At=~30 mm2 should be a good choice. Further studies are necessary to confirm the findings.

Paper Details

Date Published: 28 December 2010
PDF: 8 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 754402 (28 December 2010); doi: 10.1117/12.885879
Show Author Affiliations
Y. Zhang, Hong Kong Univ. of Science and Technology (Hong Kong, China)
Y. Gao, Hong Kong Univ. of Science and Technology (Hong Kong, China)
K. Li, Hong Kong Univ. of Science and Technology (Hong Kong, China)


Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

© SPIE. Terms of Use
Back to Top