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Accuracy design of double parallel-joints coordinate measuring machineFormat | Member Price | Non-Member Price |
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Paper Abstract
Double parallel-joints coordinate measuring machine (CMM) is a new type of coordinate measuring devices. In this
paper, measuring principle and basic structure of double parallel-joints CMM are introduced at first and then total error
sources that influence the measuring accuracy are analyzed. The possible accuracy of error sources correction is analyzed
and the total error of the instrument is calculated. The error distribution is presented on the basis of accuracy design of
the instrument. The error distribution is simulated and the error distribution law of the instrument is summarized. The
accuracy analysis and the structure design of the instrument are guided by the research in the paper, and the solid
theoretical basis is provided by the error correction to achieve the accuracy indicators of double parallel-joint CMM. The
tasks accomplished in this thesis will be provided as a solid foundation for developing double parallel-joint CMM with
our own intellectual properties and it will be accuracy higher and cost lower than the currently existing imported CMM.
Paper Details
Date Published: 28 December 2010
PDF: 6 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442D (28 December 2010); doi: 10.1117/12.885838
Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)
PDF: 6 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442D (28 December 2010); doi: 10.1117/12.885838
Show Author Affiliations
Guisuo Xia, Hefei Univ. of Technology (China)
Jiujiang Precision Measuring Technology Research Institute (China)
Yetai Fei, Hefei Univ. of Technology (China)
Jiujiang Precision Measuring Technology Research Institute (China)
Yetai Fei, Hefei Univ. of Technology (China)
Jiliang Zhao, Jiujiang Precision Measuring Technology Research Institute (China)
Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)
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