Double parallel-joints coordinate measuring machine (CMM) is a new type of coordinate measuring devices. In this paper, measuring principle and basic structure of double parallel-joints CMM are introduced at first and then total error sources that influence the measuring accuracy are analyzed. The possible accuracy of error sources correction is analyzed and the total error of the instrument is calculated. The error distribution is presented on the basis of accuracy design of the instrument. The error distribution is simulated and the error distribution law of the instrument is summarized. The accuracy analysis and the structure design of the instrument are guided by the research in the paper, and the solid theoretical basis is provided by the error correction to achieve the accuracy indicators of double parallel-joint CMM. The tasks accomplished in this thesis will be provided as a solid foundation for developing double parallel-joint CMM with our own intellectual properties and it will be accuracy higher and cost lower than the currently existing imported CMM.

Date Published: 28 December 2010
PDF: 6 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75442D (28 December 2010); doi: 10.1117/12.885838

Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)