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Proceedings Paper

Slide error measurement of a large-scale ultra-precision lathe
Author(s): Jung Chul Lee; Wei Gao; Young Jin Noh; Joo Ho Hwang; Jeoung Seok Oh; Chun Hong Park
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Paper Abstract

This paper presents the measurement of the slide error of a large-scale ultra-precision lathe with an effective fabricating length of 2000 mm. A cylinder workpiece with a diameter of 320 mm and a length of 1500 mm was mounted on the spindle of the lathe with its rotational axis along the Z-direction. Two capacitive displacement probes with a measurement range of 100 μm were mounted on the slide of lathe with its moving axis along the Z-direction. The displacement probes were placed on the two sides of the cylinder workpiece over the horizontal plane (XZ-plane). The cylinder workpiece, which was rotated by the spindle, was scanned by the displacement probes moved by the slide. The X-directional horizontal slide error can be accurately evaluated from the probe outputs by using a proposed rotatingreversal method through separating the influences of the form error of the cylinder workpiece and the rotational error of the spindle. In addition to the out-of-straightness error component, the parallelism error component with respect to the spindle axis, can also be evaluated. The out-of-straightness error component and the parallelism error component of the slide error were measured to be 3.3 μm and 1.68 arc-seconds over a slide travel range of 1450.08 mm, respectively.

Paper Details

Date Published: 28 December 2010
PDF: 8 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75440P (28 December 2010); doi: 10.1117/12.885661
Show Author Affiliations
Jung Chul Lee, Tohoku Univ. (Japan)
Wei Gao, Tohoku Univ. (Japan)
Young Jin Noh, Tohoku Univ. (Japan)
Joo Ho Hwang, Korea Institute of Machinery and Materials (Korea, Republic of)
Jeoung Seok Oh, Korea Institute of Machinery and Materials (Korea, Republic of)
Chun Hong Park, Korea Institute of Machinery and Materials (Korea, Republic of)


Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

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