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Proceedings Paper

Standoff detection of explosives: a challenging approach for optical technologies
Author(s): S. Désilets; N. Hô; P. Mathieu; J. R. Simard; E. Puckrin; J. M. Thériault; H. Lavoie; F. Théberge; F. Babin; D. Gay; R. Forest; J. Maheux; G. Roy; M. Châteauneuf
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Paper Abstract

Standoff detection of explosives residues on surfaces at few meters was made using optical technologies based on Raman scattering, Laser-Induced Breakdown Spectroscopy (LIBS) and passive standoff FTIR radiometry. By comparison, detection and analysis of nanogram samples of different explosives was made with a microscope system where Raman scattering from a micron-size single point illuminated crystal of explosive was observed. Results from standoff detection experiments using a telescope were compared to experiments using a microscope to find out important parameters leading to the detection. While detection and spectral identification of the micron-size explosive particles was possible with a microscope, standoff detection of these particles was very challenging due to undesired light reflected and produced by the background surface or light coming from other contaminants. Results illustrated the challenging approach of detecting at a standoff distance the presence of low amount of micron or submicron explosive particles.

Paper Details

Date Published: 13 May 2011
PDF: 6 pages
Proc. SPIE 8031, Micro- and Nanotechnology Sensors, Systems, and Applications III, 80312C (13 May 2011); doi: 10.1117/12.885616
Show Author Affiliations
S. Désilets, Defence Research & Development Canada, Valcartier (Canada)
N. Hô, INO (Canada)
P. Mathieu, Defence Research & Development Canada, Valcartier (Canada)
J. R. Simard, Defence Research & Development Canada, Valcartier (Canada)
E. Puckrin, Defence Research & Development Canada, Valcartier (Canada)
J. M. Thériault, Defence Research & Development Canada, Valcartier (Canada)
H. Lavoie, Defence Research & Development Canada, Valcartier (Canada)
F. Théberge, Defence Research & Development Canada, Valcartier (Canada)
F. Babin, INO (Canada)
D. Gay, INO (Canada)
R. Forest, INO (Canada)
J. Maheux, Defence Research & Development Canada, Valcartier (Canada)
G. Roy, Defence Research & Development Canada, Valcartier (Canada)
M. Châteauneuf, Defence Research & Development Canada, Valcartier (Canada)


Published in SPIE Proceedings Vol. 8031:
Micro- and Nanotechnology Sensors, Systems, and Applications III
Thomas George; M. Saif Islam; Achyut K. Dutta, Editor(s)

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