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Proceedings Paper

Analysis of electrical tomography sensitive field based on multi-terminal network and electric field
Author(s): Yongbo He; Xingguo Su; Meng Xu; Huaxiang Wang
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Paper Abstract

Electrical tomography (ET) aims at the study of the conductivity/permittivity distribution of the interested field non-intrusively via the boundary voltage/current. The sensor is usually regarded as an electric field, and finite element method (FEM) is commonly used to calculate the sensitivity matrix and to optimize the sensor architecture. However, only the lumped circuit parameters can be measured by the data acquisition electronics, it's very meaningful to treat the sensor as a multi terminal network. Two types of multi terminal network with common node and common loop topologies are introduced. Getting more independent measurements and making more uniform current distribution are the two main ways to minimize the inherent ill-posed effect. By exploring the relationships of network matrixes, a general formula is proposed for the first time to calculate the number of the independent measurements. Additionally, the sensitivity distribution is analyzed with FEM. As a result, quasi opposite mode, an optimal single source excitation mode, that has the advantages of more uniform sensitivity distribution and more independent measurements, is proposed.

Paper Details

Date Published: 28 December 2010
PDF: 7 pages
Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441Y (28 December 2010); doi: 10.1117/12.885608
Show Author Affiliations
Yongbo He, Civil Aviation Univ. of China (China)
Xingguo Su, Civil Aviation Univ. of China (China)
Meng Xu, Civil Aviation Univ. of China (China)
Huaxiang Wang, Tianjin Univ. (China)

Published in SPIE Proceedings Vol. 7544:
Sixth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Xianfang Wen, Editor(s)

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